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Alto CVE-2026-90041 Multiple Vendors

[CVE-2026-90041] In the Linux kernel, the following vulnerability has been resolved: HID: sony: clean up device list…

Vulnerabilidad · Publicado 16/09/2026

8.8
CVSS 3.x
04 Medio7 Alto9 Crítico10
Severidad: Alto
Resumen ejecutivo

In the Linux kernel, the following vulnerability has been resolved:

HID: sony: clean up device list on probe failure

sony_input_configured() adds some controllers to sony_device_list before
HID core registers their input devices. input_register_device() can fail
after the callback returns successfully. sony_probe() then observes that
HID_CLAIMED_INPUT is clear and unwinds, but only stops the HID…

Descripción técnica

Descripción técnica

In the Linux kernel, the following vulnerability has been resolved: HID: sony: clean up device list on probe failure sony_input_configured() adds some controllers to sony_device_list before HID core registers their input devices. input_register_device() can fail after the callback returns successfully. sony_probe() then observes that HID_CLAIMED_INPUT is clear and unwinds, but only stops the HID hardware. The devres-managed sony_sc is freed while its list node remains linked, so the next matching controller traverses freed memory. Initialize the list node and device ID to inactive states. Make list removal idempotent and run the driver-private cleanup on every probe failure path. This also makes a second cleanup safe when sony_input_configured() already unwound a partial initialization before sony_probe() handles the missing input claim. Found by 0sec (https://0sec.ai) using automated source analysis; verified against the HID input registration and probe unwind paths.

Puntuación CVSS

Score: 8.8/10 — Severidad: HIGH — Estado NIST: Received

CVSS:3.1/AV:A/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

Fuente oficial

Publicado en NIST NVD.

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  • Consultar las referencias en NIST NVD para actualizaciones de estado
  • Priorizar según el score CVSS y la exposición de los sistemas afectados
Esta alerta fue generada automáticamente a partir del NVD del NIST.